| 內容/備註 |
Electrostatic discharge (ESD) is a major concern for microchip reliability. As the operating frequency of microchips continues to increase, ESD on-chip protection becomes more and more demanding and challenging. This talk presents a systematic approach to construct the ESD protection structure for RF applications based on the requirements of breakdown voltage and heat dissipation. Specifically, an ESD protection structure including diodes and supply clamps will be considered, and the design and optimization of such a structure based on the 0.13-mm CMOS technology will be addressed.
About the speaker:
Juin J. Liou received the B.S. (honors), M.S., and Ph.D. degrees in electrical engineering from the University of Florida, Gainesville, in 1982, 1983, and 1987, respectively. In 1987, he joined the Department of Electrical and Computer Engineering at the University of Central Florida, Orlando, where he is now a Professor. His current research interests are micro/nanoelectronics computer-aided design, RF device modeling and simulation, and semiconductor manufacturing and reliability.
Dr. Liou has published six textbooks (another in progress), more than 190 journal papers (including 14 invited articles), and more than 140 papers (including 46 keynote or invited papers) in international and national conference proceedings. He has been awarded more than $5.0 million of research grants from federal agencies (i.e., NSF, DARPA, Navy, Air Force, Army, NIST), state government, and industry (i.e., Semiconductor Research Corp., Intersil Corp., Intel Corp., Lucent Technologies, Alcatel Space, Conexant Systems, Texas Instruments, Lockheed Martin), and has held consulting positions with research laboratories and companies in the United States, Japan, Taiwan, and Singapore. In addition, Dr. Liou serves as a technical reviewer for various journals and publishers, a chair or member of the technical program committee for several international conferences, and a regional editor (in USA, Canada and South America) for the Microelectronics Reliability, an international journal published by Elsevier Science.
Dr. Liou received ten different awards on excellence in teaching and research from the University of Central Florida and six different awards from the IEEE Electron Device Society. Among them, he was awarded the UCF Distinguished Researcher Award three times (1992, 1998, 2002) and the IEEE Joseph M. Biedenbach Outstanding Educator Award in 2004 for his exemplary teaching, research, and international collaboration.
Dr. Liou is an IEEE EDS Distinguished Lecturer, IEEE EDS Treasurer, Chair of the IEEE EDS Finance Committee, Vice-Chair of the IEEE EDS Regions/Chapters Committee, member of the IEEE EDS Administrative Committee, member of the IEEE EDS Educational Activities Committee, member of the IEEE EDS Ex-Officio Administrative Committee, senior member of the IEEE, and courtesy professor of Huazhong University of Science and Technology, Wuhan, China, of Zhejiang University, Hangzhou, China, and of South China University of Technology, Guangzhou, China.
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